High Speed Testing

Test Equipment

The UC Berkeley Cryoelctronics Research Group has state-of-the-art high speed test equipment. Testing is possible from low speed (kHz) to ultra-high speed (20 GHz). We are also able to measure bit error rates of superconducting cirtucits up to 12.5 GHz.

Here is an example of an Eye Pattern from the HP 12 GHz Data Generator

Eye Pattern





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